- 易迪拓培训,专注于微波、射频、天线设计工程师的培养
EMC测试中的一个case，期待指导.
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The phone failed at the spurious emission test about -29dBm at normal mode DCS1800.
Then I tested it at local mode and control the power level to 0.It performs good about -35dBm.
Then I covered whole phone with copper sheet except the antenna. it perfoms good at normal mode.
Then I remove the copper around Sim lid ,it becomes bad again.
So , can I confirm the problem is the sim lid ? and what should I do next?
Please help me out ！
Then I tested it at local mode and control the power level to 0.It performs good about -35dBm.
Then I covered whole phone with copper sheet except the antenna. it perfoms good at normal mode.
Then I remove the copper around Sim lid ,it becomes bad again.
So , can I confirm the problem is the sim lid ? and what should I do next?
Please help me out ！
1. i think tthe spurious power is emitted from SIM lid too because local mode(SIM isn't active) is OK
2. check the which freq is failed
3. wait for near-field scan test result
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