Splitting Measured S-parameters

Hello All,

Back at a previous company I had gotten a simulation file that allowed me to split a measured S-parameter into two S-parameter files. The assumption was the two files were back to back or

S11A = S22B
S22A = S11B (required)

S21A = S12A (required)
S21B = S12B (required)

and if needed S21A=S21B

I believe it was an iterative solution.

The reason for doing this is is for de-embedding. I have an evaluation board which is being measured from 100 kHz to 9 GHz and I need the data to the device. I have a through line that has the the device removed. Yes there will be some error to this, but TRL calibration can not be used due to the low frequency and port extension can not be used to to the high frequency.

Since I no longer work for the former company I have no access to the simulations. Does anyone remember or have this solution. I did get it from Agilent at the time.

Thanks in advance.

Mike Virostko
Integrated Device Technology

The following document on the Knowledge Center contains a decription and an example workspace for "Splitting S-Parameter data into two equal halves using ADS optimization".

http://edadocs.software.keysight.com/display/eesofkcads/Split+S-parameter+half+two

Thanks !

Mike Virostko

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