In cst， when I excite the 1v/m， it is not 1v/m as a results.

In CST, MWS, frequency solver,

I excite the x-polarized plane wave of 1v/m at the end of the z_min.

Every volume is filled with air then there is no problem. Every field intensity

in every point is about 1v/m.

but,

when every volume is filled with dielectric material(not vaccum),

every field intensity is varying with the every position. How can I reduce

this phenomenon? I excite the plane wave

from z_min side which is filled with SiO2 substrate(not vaccum..) to the metallic

nano aperture .

I want to

guarantee that my incident intensity is 1 at the near of the entrance of the

nano-aperture.

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